Statistical process control charts track a process over time — Shewhart variable charts (I-MR, Xbar-R, Xbar-S), attribute charts (p, np, c, u) and the time-weighted EWMA and CUSUM — flagging control-limit and run-rule violations.
A control chart separates common-cause variation (inherent noise) from special-cause variation (something changed). Points are plotted in time order against ±3σ control limits computed from the data's own short-term variation — not the spec limits. Xbar-R/S monitor subgroup means with a paired dispersion chart; I-MR handles individual measurements via the moving range.
Shewhart charts react quickly to large shifts but are slow on small sustained ones — that's what EWMA (an exponentially weighted average) and CUSUM (cumulative sums above/below target) are for: they accumulate evidence across points and detect shifts of ~1σ far sooner.
Attribute charts monitor counts: p/np for the proportion/number of defective units per lot, c/u for the number/rate of defects per inspection unit.
A measurement/count column in time order + chart type; subgroup size (Xbar charts), a lot-size column (p/np/u), λ (EWMA), or k and h (CUSUM).
The control chart with centre line, ±3σ limits, and flagged violations (beyond-limit points; run-rule points), plus the paired R/S/MR chart where applicable.
A point beyond the limits or a run-rule signal means a special cause — investigate that sample. Never confuse control limits (voice of the process) with spec limits (voice of the customer).